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Hyunjin Yoo: Image based reflectance analysis

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Thursday, 21. March 2013, 13:00
Category: Lectures & Presentations | created by Nicole Brosch


In this talk, the BRDF measurement system is presented. For many years, texture mapping or vertex colors have been widely used to represent an appearance of the object in many applications. However, most materials require physical reflectance properties to appear more realistic. We built systems that can measure Bidirectional Reflectance Distribution Function (BRDF) of opaque materials. Specially, the research on color characterization method of high dynamic range imaging (HDRI) system for BRDF acquisition system is introduced. 


Hyunjin Yoo received the M.S. degree in Information and Communications and the Ph.D. degree in Information and Mechatronics from the Gwangju Institute of Science and Technology (GIST), Gwangju, Korea, in 2005 and 2011, respectively. She is currently a PostDoc Researcher in Faculty of Informatics, Vienna University of Technology. She was an intern in Microsoft Research Asia at Beijing (Aug. 2007 ~ Feb. 2008). She worked as a senior researcher at Convergence laboratory, CTO, LG electronics from 2011-2012. Her main interests lie in HDRI, color device characterization, BRDF, computer vision/graphics, and computational photography.


Location Seminar Room 188/2, 1040 Vienna, Favoritenstraße 9-11 4th Floor, Staircase 3
Contact Nicole Brosch